Optical Science and
Technology Center


Check out the latest news and information relating to the Optical Science and Technology Center:

May 13, 2016
Anthony Zhang

Congratulations to Anthony Zhang, UIMF employee and ICRU fellow student, for his project has been selected to be a part of ICRU’s 2016 digital exhibit on undergraduate research. Anthony and his research project within the UIMF will be part of the UI Mobile Museum showcase.  

Congrats, Anthony!

Read more about Anthony's project and all the University of Iowa Mobile Museum projects here!

Visit the University of Iowa Mobile Museum here!

November 23, 2015

Iowa Now 

Master tinkerer

UI graduate student lands NASA fellowship to create sophisticated space X-ray instrument

Graduate student Jake McCoy is creating a new tool that could help scientists find elusive, missing matter in the universe. The tool McCoy is creating will precisely define X-ray patterns from remote corners of space known as the warm-hot intergalactic medium. Photo by Tim Schoon.

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August 26, 2015
Electron Beam Nanolithography Tool

OSTC's Microfabrication Facility introduces new Electron Beam Nanolithography tool for nano-scale device fabrication

Wednesday, August 26, 2015

A new and one-of-its-kind facility in Iowa recently opened its doors to researchers in Nanotechnology. The University of Iowa Microfabrication Facility (UIMF) within the Optical Science and Technology Center (OSTC) has recently installed an Electron Beam Nanolithography Tool for nano-scale device fabrication in the newly constructed ISO 5 cleanroom, located in the Iowa Advanced Technology Laboratories building. The delivery of this state-of-the-art lab has been made possible thanks to funding...

July 24, 2015

The state-of-the-art and high-performance instrument, Raith Voyager Electron-Beam Nanolithography System has now been installed in the UIMF ISO 5 cleanroom (IATL 172). The tool with a 50kV electron-beam column, less than 2.5 nm beam size and 50 MHz pattern generator can pattern features down to 10 nm or smaller over large areas in the millimeter and centimeter range and can provide a pattern placement accuracy of sub-10 nm. The tool is now available for device fabrication and research in Nanoscale Science and Engineering.

May 1, 2015


Morning Session / Oral Presentations

Iowa Memorial Union Iowa Theater, Room 166

8:30-8:40 - welcome

8:40-9:25 - David Gundlach, NIST, “Combining Opto-electrical Measurements to Probe Polaron Properties in Organic Semiconductors”

9:25-9:55 - Markus Wohlgenannt, University of Iowa, “Organic magnetoelectroluminescence for room temperature transduction between magnetic and optical information”

9:55-10:25 - Fatima Toor, University of Iowa, “High performance solar cells and coatings using optical metamaterials”

10:25-10:45 - break

10:45-11:15 - John Prineas, University of Iowa, “How a promising detector material became a remarkable light source”

11:15-12:00 - Dan Wasserman, University...